X-RAY EMISSION ANALYSIS OF PAINTS BY THIN FILM METHOD

被引：8

作者：

MCGINNESS, JD

SCOTT, RW

MORTENSE.JS

机构：

[1] Analytical Research Department, Sherwin- Williams Research Center, Chicago

来源：

ANALYTICAL CHEMISTRY | 1969年 / 41卷 / 13期

关键词：

D O I：

10.1021/ac60282a037

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Quantitative X-ray emission analysis of paints is seriously complicated by the extreme variation in the absorption coefficient of the matrix due to the wide variety of compounds which may be used for the pigmentation. Methods for determination of specific elements in complex systems by means of matrix matching, dilution, and thin film-controlled mass have been reported (1-6). However, none of these techniques alone have been found adequate when applied to the analysis of paint. © 1969, American Chemical Society. All rights reserved.

引用

页码：1858 / +

页数：1

共 9 条

[1] X-RAY FLUORESCENCE DETERMINATION OF COBALT ZINC + IRON IN ORGANIC MATRICES
BARTKIEWICZ, SA
HAMMATT, EA
[J]. ANALYTICAL CHEMISTRY, 1964, 36 (04) : 833 - &
[2] FLUORESCENT X-RAY SPECTRAL ANALYSIS OF POWDERED SOLIDS BY MATRIX DILUTION
GUNN, EL
[J]. ANALYTICAL CHEMISTRY, 1957, 29 (02) : 184 - 189
[3] X-RAY FLUORESCENT INTENSITY OF ELEMENTS EVAPORATED FROM SOLUTION ONTO THIN FILM
GUNN, EL
[J]. ANALYTICAL CHEMISTRY, 1961, 33 (07) : 921 - &
[4] GUNN EL, 1967, ADVANCES XRAY ANALYS, V11, P164
[5] Liebhafsky H.A., 1960, XRAY ABSORPTION EMIS
[6] MCGINNESS JD, 1966, STANDARD METHODS C B, V3, pCH54
[7] MCGINNESS JD, 1966, 5 NAT M SOC APPL SPE
[8] PREDICTION OF X-RAY FLUORESCENT INTENSITIES AND INTERELEMENT EFFECTS
MITCHELL, BJ
[J]. ANALYTICAL CHEMISTRY, 1961, 33 (07) : 917 - &
[9] SALMON ML, 1962, ADVAN XRAY ANAL, V5, P389

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