ATOMIC-FORCE MICROSCOPY INVESTIGATIONS ON POLYMER LATEX FILMS

被引：21

作者：

ANCZYKOWSKI, B

CHI, LF

FUCHS, H

机构：

[1] Physikalisches Insitut, Westfälische Wilhelms-Universität Münster, Münster, D-48149

来源：

SURFACE AND INTERFACE ANALYSIS | 1995年 / 23卷 / 06期

关键词：

D O I：

10.1002/sia.740230614

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Atomic force microscopy (AFM) is applied on two different types of thin latex films. Polystyrene dispersion particles are prepared by various methods to form well-ordered monolayers and multilayers. Atomic force microscopy serves as a tool to study the surface structures of such films and to find the optimal preparation conditions. The micromorphology of the second system, an adhesive tape, was imaged successfully by AFM running in dynamic mode. Besides the morphological studies, the interaction between the sticky surface and the AFM tip is measured by the damping of the cantilever oscillation versus tip-sample distance.

引用

页码：416 / 425

页数：10

共 14 条

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