LORENTZIAN CONTRIBUTIONS TO X-RAY LINESHAPES IN SI(LI) SPECTROSCOPY

被引：18

作者：

CAMPBELL, JL

WANG, JX

机构：

[1] Department of Physics, University of Guelph, Guelph, Ontario

来源：

X-RAY SPECTROMETRY | 1992年 / 21卷 / 05期

关键词：

D O I：

10.1002/xrs.1300210506

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

If the lineshape response of a Si(Li) detector is measured using monoenergetic x-rays provided by a monochromator, it must be convoluted by a Lorentzian of appropriate width in order to represent the lineshape encountered in directly measured x-ray spectra. It is shown that the Lorentzian component is responsible for a significant fraction of low-energy peak tailing, a phenomenon usually attributed to detector imperfections.

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页码：223 / 227

页数：5

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