IMAGING OF URANIUM ATOMS WITH ELECTRON-MICROSCOPE BY PHASE-CONTRAST

被引：18

作者：

PARSONS, JR ^{[1
]}

JOHNSON, HM ^{[1
]}

HOELKE, CW ^{[1
]}

HOSBONS, RR ^{[1
]}

机构：

[1] ATOM ENERGY CANADA LTD,NUCL LABS,CHALK RIVER,ONTARIO,CANADA

来源：

PHILOSOPHICAL MAGAZINE | 1973年 / 27卷 / 06期

关键词：

D O I：

10.1080/14786437308226892

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1359 / 1368

页数：10

共 16 条

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[2]

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[4]

FRANK J, 1969, OPTIK, V30, P171

[5]

HANSZEN KJ, 1971, ADV OPTICAL ELECTRON, V4

[6] A TEST OBJECT AND CRITERIA FOR HIGH RESOLUTIONELECTRON MICROSCOPY [J].

HEIDENRE.RD ;

HESS, WM ;

BAN, LL .

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[7]

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[8] THICKNESS ESTIMATION OF CARBON FILMS BY ELECTRON MICROSCOPY OF TRANSVERSE SECTIONS AND OPTICAL DENSITY MEASUREMENTS [J].

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JOHNSON, HM ;

PARSONS, DF .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (12) :5421-&

[9]

NIEHRS H, 1969, OPTIK, V30, P273

[10] INFLUENCE OF DISLOCATIONS IN AU ON A CROSSED LATTICE IMAGE [J].

PARSONS, JR ;

HOELKE, CW .

PHILOSOPHICAL MAGAZINE, 1970, 22 (179) :1071-&

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