HIGH-RESOLUTION PROBE FOR SCANNING ELECTROSTATIC POTENTIAL PROFILES ACROSS SURFACES

被引：19

作者：

SCRUTON, B ^{[1
]}

BLOTT, BH ^{[1
]}

机构：

[1] UNIV SOUTHAMPTON,PHYS DEPT,SOUTHAMPTON SO9 5NH,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1973年 / 6卷 / 05期

关键词：

D O I：

10.1088/0022-3735/6/5/019

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：472 / 474

页数：3

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[8] MEASUREMENT OF LOCALIZED SURFACE POTENTIAL DIFFERENCES [J].

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