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TRANSIENT PHOTOCURRENTS IN SOS STRUCTURES
被引:17
作者
:
KJAR, RA
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT, ELECT RES DIV, ANAHEIM, CA 92800 USA
ROCKWELL INT, ELECT RES DIV, ANAHEIM, CA 92800 USA
KJAR, RA
[
1
]
KINOSHITA, G
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT, ELECT RES DIV, ANAHEIM, CA 92800 USA
ROCKWELL INT, ELECT RES DIV, ANAHEIM, CA 92800 USA
KINOSHITA, G
[
1
]
机构
:
[1]
ROCKWELL INT, ELECT RES DIV, ANAHEIM, CA 92800 USA
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1973年
/ NS20卷
/ 06期
关键词
:
D O I
:
10.1109/TNS.1973.4327413
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:315 / 318
页数:4
相关论文
共 6 条
[1]
RANGE OF SECONDARY ELECTRONS IN SAPPHIRE
HARRITY, JW
论文数:
0
引用数:
0
h-index:
0
HARRITY, JW
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1970,
NS17
(06)
: 200
-
&
[2]
HARRITY JW, 1969, GA9801 GULF GEN AT I
[3]
KJAR RA, 1971, TR71143 AFAL ROCKW I, V1
[4]
KJAR RA, 1971, TR71143 AFAL ROCKW I, V2
[5]
MOTT NF, 1948, ELECTRONIC PROCESSES
[6]
SCALING LAWS FOR IONIZATION EFFECTS IN INSULATORS
VANLINT, VAJ
论文数:
0
引用数:
0
h-index:
0
VANLINT, VAJ
HARRITY, JW
论文数:
0
引用数:
0
h-index:
0
HARRITY, JW
FLANAGAN, TM
论文数:
0
引用数:
0
h-index:
0
FLANAGAN, TM
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1968,
NS15
(06)
: 194
-
&
←
1
→
共 6 条
[1]
RANGE OF SECONDARY ELECTRONS IN SAPPHIRE
HARRITY, JW
论文数:
0
引用数:
0
h-index:
0
HARRITY, JW
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1970,
NS17
(06)
: 200
-
&
[2]
HARRITY JW, 1969, GA9801 GULF GEN AT I
[3]
KJAR RA, 1971, TR71143 AFAL ROCKW I, V1
[4]
KJAR RA, 1971, TR71143 AFAL ROCKW I, V2
[5]
MOTT NF, 1948, ELECTRONIC PROCESSES
[6]
SCALING LAWS FOR IONIZATION EFFECTS IN INSULATORS
VANLINT, VAJ
论文数:
0
引用数:
0
h-index:
0
VANLINT, VAJ
HARRITY, JW
论文数:
0
引用数:
0
h-index:
0
HARRITY, JW
FLANAGAN, TM
论文数:
0
引用数:
0
h-index:
0
FLANAGAN, TM
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1968,
NS15
(06)
: 194
-
&
←
1
→