HETERODYNE INTERFEROMETERS - PRACTICAL LIMITATIONS AND IMPROVEMENTS

被引：35

作者：

CRETIN, B

XIE, WX

WANG, S

HAUDEN, D

机构：

[1] CNRS, Besancon, Fr, CNRS, Besancon, Fr

来源：

OPTICS COMMUNICATIONS | 1988年 / 65卷 / 03期

关键词：

D O I：

10.1016/0030-4018(88)90340-9

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：157 / 162

页数：6

共 12 条

[1]

ASH EA, 1985, ACOUSTICAL IMAGING, V14, P343

[2] DESIGN OF A 3/2-ORDER PHASE-LOCKED LOOP FOR IMPROVED LASER PROBE RESOLUTION [J].

CRETIN, B ;

MOLLIER, JC .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (04) :660-664

[3]

CRETIN B, 1987, ACOUSTICAL IMAGING, V15, P423

[4] ACOUSTIC-SURFACE-WAVE AMPLITUDE AND PHASE MEASUREMENTS USING LASER PROBES [J].

DELARUE, RM ;

ASH, EA ;

MASON, IM ;

HUMPHRYES, RF .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1972, 119 (02) :117-+

[5]

HAUDEN D, 1984, 1984 IEEE ULTR S P, P249

[6]

KROLL M, 1982 IEEE ULTR S P, P86

[7] PHOTO-DISPLACEMENT MICROSCOPY USING A SEMICONDUCTOR-LASER [J].

MARTIN, Y ;

ASH, EA .

ELECTRONICS LETTERS, 1982, 18 (18) :763-764

[8] LASER HETERODYNE MEASUREMENT OF SMALL ARBITRARY DISPLACEMENTS [J].

OHTSUKA, Y ;

SASAKI, I .

OPTICS COMMUNICATIONS, 1974, 10 (04) :362-365

[9] PHOTOTHERMAL DISPLACEMENT SPECTROSCOPY - AN OPTICAL PROBE FOR SOLIDS AND SURFACES [J].

OLMSTEAD, MA ;

AMER, NM ;

KOHN, S ;

FOURNIER, D ;

BOCCARA, AC .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1983, 32 (03) :141-154

[10]

ROYER D, 1985 IEEE ULTR S P, P432

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