NEW METHODS OF X-RAY-DIFFRACTION SPECTROMETRY .1. IMAGE-FORMATION IN CURVED CRYSTALS

被引：9

作者：

BREMER, J

SORUM, H

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1980年 / 13卷 / AUG期

关键词：

D O I：

10.1107/S0021889880012289

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：354 / 358

页数：5

共 11 条

[1]

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[2]

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[3]

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[4]

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[5]

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[6]

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[7] DETECTION OF MULTIPLET STRUCTURE IN CU K-ALPHA-1,K-ALPHA-2 BY MEANS OF A MONOLITHIC DOUBLE CRYSTAL SPECTROMETER [J].

SAUDER, WC ;

HUDDLE, JR ;

WILSON, JD ;

LAVILLA, RE .

PHYSICS LETTERS A, 1977, 63 (03) :313-315

[8] NEW HIGH-DISPERSION HIGH-RESOLUTION X-RAY SPECTROMETER [J].

SCHNOPPER, HW ;

KALATA, K .

APPLIED PHYSICS LETTERS, 1969, 15 (05) :134-+

[9] OBSERVATION OF FINE STRUCTURES OF CHROMIUM KALPHA1,2 LINES WITH A HIGH RESOLUTION 3 CRYSTAL SPECTROMETER [J].

SHAH, M ;

DASGUPTA, K .

PHYSICS LETTERS A, 1969, A 29 (09) :570-&

[10] NEW METHODS OF X-RAY-DIFFRACTION SPECTROMETRY .2. PRINCIPLE AND PERFORMANCE OF A NOVEL TYPE OF CURVED-CRYSTAL SPECTROMETER [J].

SORUM, H ;

BREMER, J .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1980, 13 (AUG) :359-363

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