THE CU/AG(111) INTERFACE STUDIED BY ELECTRON-ENERGY LOSS FINE-STRUCTURE SPECTROSCOPY

被引：3

作者：

HITCHCOCK, AP

DECRESCENZI, M

TYLISZCZAK, T

机构：

来源：

PHYSICA B | 1989年 / 158卷 / 1-3期

关键词：

D O I：

10.1016/0921-4526(89)90431-6

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：666 / 667

页数：2

共 6 条

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[3]

HITCHCOCK AP, 1988, P XAFS, V5

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HORNG, CT ;

VOOK, RW .

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[5] SEGREGATION IN THIN-FILMS [J].

MORANLOPEZ, JL ;

KERKER, G ;

BENNEMANN, KH .

TYLISZCZAK, T ;

DECRESCENZI, M ;

HITCHCOCK, AP .

PHYSICAL REVIEW B, 1988, 37 (18) :10664-10673