MICROSTRUCTURE OF GAMMA-FE2O3 PARTICLES DETERMINED BY X-RAY-LINE BROADENING OF ORIENTED SAMPLES

被引：4

作者：

KLINGELHOFER, P

MAROSI, L

SCHWAB, E

机构：

[1] BASF Aktiengesellschaft

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1991年 / 101卷 / 1-3期

关键词：

D O I：

10.1016/0304-8853(91)90746-W

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

For small-diameter gamma-Fe2O3 pigments X-ray line broadening measurements on random samples do not allow direct conclusions to be made about the crystallite size because in contrast to large particles the small ones develop anisometric grains during annealing. This can only be detected in specimens with a perpendicular orientation of the particle long axis relative to the surface.

引用

页码：248 / 250

页数：3