SILICON-CARBIDE AND SIC-ALN SOLID-SOLUTION P-N STRUCTURES GROWN BY LIQUID-PHASE EPITAXY

被引:15
作者
DMITRIEV, VA [1 ]
机构
[1] HOWARD UNIV,MAT SCI RES CTR,WASHINGTON,DC 20059
来源
PHYSICA B | 1993年 / 185卷 / 1-4期
关键词
D O I
10.1016/0921-4526(93)90276-C
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We will review the principles, history, state-of-the-art and perspectives of liquid-phase epitaxy (LPE) of SiC p-n structures. SiC growth from a Si melt as well as from alternative melts will be described together with p-n junction characteristics. The LPE technique controls the doping concentration in SiC from 10(15) to 10(20) cm-3. High-quality 6H-SiC and 4H-SiC multilayer structures and p-n junctions have been grown by LPE. SiC p-n junction growth from the liquid phase requires temperatures as low as 1100-degrees-C. New directions of SiC LPE will be discussed: (1) heteropolytype growth and (2) growth of the SiC-based solid solution.
引用
收藏
页码:440 / 452
页数:13
相关论文
共 41 条
  • [1] Anikin M., 1991, FIZ TEKH POLUPROVODN, V25, P479
  • [2] ANIKIN MM, 1989, FIZ TEKH POLUPROV, V23, P1813
  • [3] SOLUTION GROWN SIC P-N JUNCTIONS
    BRANDER, RW
    SUTTON, RP
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1969, 2 (03) : 309 - &
  • [4] Britun V. F., 1986, Soviet Physics - Technical Physics, V31, P129
  • [5] CHELNOKOV VE, 1992, MAT SCI ENG B-FLUID, V2, P103
  • [6] THIN-FILM DEPOSITION AND MICROELECTRONIC AND OPTOELECTRONIC DEVICE FABRICATION AND CHARACTERIZATION IN MONOCRYSTALLINE ALPHA AND BETA SILICON-CARBIDE
    DAVIS, RF
    KELNER, G
    SHUR, M
    PALMOUR, JW
    EDMOND, JA
    [J]. PROCEEDINGS OF THE IEEE, 1991, 79 (05) : 677 - 701
  • [7] DAVIS RF, 1992, APR WORKSH WID BANDG
  • [8] Dmitriev V. A., 1985, Soviet Technical Physics Letters, V11, P98
  • [9] Dmitriev V. A., 1991, Soviet Technical Physics Letters, V17, P214
  • [10] Dmitriev V. A., 1986, Soviet Technical Physics Letters, V12, P318