STUDIES OF DEFECTS AND SURFACES BY CHANNELING

[1] Andersen J. U., 1971, Radiation Effects, V7, P25, DOI 10.1080/00337577108232561

[2] APPLETON BR, 1976, ION BEAM SURFACE LAY, V2, P607

[3] MONTE CARLO CHANNELING CALCULATIONS [J]. PHYSICAL REVIEW B, 1971, 3 (05): : 1527 - &

[4] BARRETT JH, 1976, 4TH P C SCI IND APPL, P571

[5] ROTATING SAMPLE TECHNIQUE FOR MEASUREMENT OF RANDOM BACKSCATTERING YIELDS FROM CRYSTALS AND ITS APPLICATION TO BETA-ALUMINA [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 225 - 228

[6] BOGH E, 1973, CHANNELING, pCH15

[7] CARSTANJEN HD, 1976, ION BEAM SURFACE LAY, V2, P497

[8] MEASUREMENT OF SURFACE RELAXATION BY MEV ION BACKSCATTERING AND CHANNELING [J]. PHYSICS LETTERS A, 1975, 54 (03) : 239 - 240

[9] SURFACE RELAXATION EFFECTS IN (111) PLATINUM MEASURED BY BACKSCATTERING AND CHANNELING [J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 609 - 613

[10] DAVIES JA, 1973, CHANNELING, pCH13

[1] Andersen J. U., 1971, Radiation Effects, V7, P25, DOI 10.1080/00337577108232561

[2] APPLETON BR, 1976, ION BEAM SURFACE LAY, V2, P607

[3] MONTE CARLO CHANNELING CALCULATIONS [J]. PHYSICAL REVIEW B, 1971, 3 (05): : 1527 - &

[4] BARRETT JH, 1976, 4TH P C SCI IND APPL, P571

[5] ROTATING SAMPLE TECHNIQUE FOR MEASUREMENT OF RANDOM BACKSCATTERING YIELDS FROM CRYSTALS AND ITS APPLICATION TO BETA-ALUMINA [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 225 - 228

[6] BOGH E, 1973, CHANNELING, pCH15

[7] CARSTANJEN HD, 1976, ION BEAM SURFACE LAY, V2, P497

[8] MEASUREMENT OF SURFACE RELAXATION BY MEV ION BACKSCATTERING AND CHANNELING [J]. PHYSICS LETTERS A, 1975, 54 (03) : 239 - 240

[9] SURFACE RELAXATION EFFECTS IN (111) PLATINUM MEASURED BY BACKSCATTERING AND CHANNELING [J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 609 - 613

[10] DAVIES JA, 1973, CHANNELING, pCH13