CRYSTALLOGRAPHIC DEPENDENCE OF CHEMISORPTION BONDING FOR SULFUR ON (001), (110), AND (111) NICKEL

被引：188

作者：

DEMUTH, JE ^{[1
]}

JEPSEN, DW ^{[1
]}

MARCUS, PM ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW LETTERS | 1974年 / 32卷 / 21期

关键词：

D O I：

10.1103/PhysRevLett.32.1182

中图分类号：

O4 [物理学];

学科分类号：

070305 [高分子化学与物理];

摘要：

引用

页码：1182 / 1185

页数：4

共 14 条

[1]

SMALL NI-S BOND LENGTHS IN A C(2 BY 2) OVERLAYER OF SULFUR ON NI(001) [J].

DEMUTH, JE ;

JEPSEN, DW ;

MARCUS, PM .

SOLID STATE COMMUNICATIONS, 1973, 13 (09) :1311-1313

[2]

CHEMISORPTION BONDING OF C(2 BY 2) CHALCOGEN OVERLAYERS ON NI(001) [J].

DEMUTH, JE ;

JEPSEN, DW ;

MARCUS, PM .

PHYSICAL REVIEW LETTERS, 1973, 31 (08) :540-542

[3]

DEMUTH JE, TO BE PUBLISHED

[4]

DEMUTH JE, 1973, 7 P LOW EN EL DIFFR

[5]

DETERMINATION OF ADSORPTION SITE BY LOW-ENERGY ELECTRON-DIFFRACTION FOR IODINE ON SILVER (111) [J].

FORSTMANN, F ;

BERNDT, W ;

BUTTNER, P .

PHYSICAL REVIEW LETTERS, 1973, 30 (01) :17-19

[6]

GMELIN SG, 1966, HDB ANORGANISCHEN 2, V57

[7]

DIRECT VISUALIZATION OF ADATOM SITES ON A CRYSTAL [J].

GRAHAM, WR ;

EHRLICH, G .

JOURNAL OF CHEMICAL PHYSICS, 1973, 59 (06) :3417-3418

[8]

HAGSTRUM HD, 1972, SURFACE SCIENCE, V30, P505

[9]

JEPSEN DW, 1972, PHYS REV B, V6, P3864

[10]

ANALYSIS OF LOW-ENERGY-ELECTRON DIFFRACTION INTENSITY PROFILES FROM (100) AND (111) FACES OF NICKEL [J].

LARAMORE, GE .

PHYSICAL REVIEW B, 1973, 8 (02) :515-527

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