DELOCALIZATION CORRECTIONS FOR ELECTRON CHANNELING ANALYSIS

被引：85

作者：

PENNYCOOK, SJ

机构：

来源：

ULTRAMICROSCOPY | 1988年 / 26卷 / 1-2期

关键词：

D O I：

10.1016/0304-3991(88)90397-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：239 / 248

页数：10

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