THE INFLUENCE OF THE TEST FIXTURE ON SHIELDING EFFECTIVENESS MEASUREMENTS

被引:14
作者
CATRYSSE, J
DELESIE, M
STEENBAKKERS, W
机构
[1] BEKAERT BFT,B-8550 ZWEVEGEM,BELGIUM
[2] DSM RES & PATENTS,6160 MD GELEEN,NETHERLANDS
关键词
D O I
10.1109/15.155853
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the past, different test cells were used to measure the shielding effectiveness (SE) of materials against electromagnetic radiation, for far-field (or plane wave) conditions. Only recently, a new standard was approved. However, some errors may occur, especially in the case of filled conductive plastics, where the conductive layer is not directly accessible from the surface of the material. As well as reporting on some of the difficulties and problems encountered when measuring the SE of this family of materials, this communication proposes a different technique for measuring far-field conditions.
引用
收藏
页码:348 / 351
页数:4
相关论文
共 5 条
[1]  
CATRYSSE J, 1991, 9TH P INT ZUR S EMC
[2]  
CATRYSSE J, 1990, 7TH P INT C EL COMP
[3]  
HARIYA E, INSTRUMENTS MEASURIN
[4]   TECHNIQUES FOR MEASURING THE ELECTROMAGNETIC SHIELDING EFFECTIVENESS OF MATERIALS .1. FAR-FIELD SOURCE SIMULATION [J].
WILSON, PF ;
MA, MT ;
ADAMS, JW .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1988, 30 (03) :239-250
[5]  
ASTMES7 STAND