QUANTITATIVE-ANALYSIS OF THE DEFORMATION AND CHEMICAL PROFILES OF STRAINED MULTILAYERS

被引：64

作者：

BAYLE, P

DEUTSCH, T

GILLES, B

LANCON, F

MARTY, A

THIBAULT, J

机构：

[1] CEA / Département de Recherche Fondamentale sur la Matière Condensée / SP2M, Centre d'Etudes Nucléaires

来源：

ULTRAMICROSCOPY | 1994年 / 56卷 / 1-3期

关键词：

D O I：

10.1016/0304-3991(94)90149-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Deformation in Au/Ni strained multilayers has been characterised by HREM image processing. The HREM strain profile has been used to determine the Ni chemical profile in the structure, which is compared to the chemical profile obtained by scanning PEELS analysis through the multilayer. The structural evolution of the Au/Ni MBE multilayer grown with an increasing number of Ni layers has been characterised. When the thickness of Ni becomes larger than 5 monolayers, the growth is no longer pseudo-morphological: a structural change occurs which has been shown in numerical simulations too.

引用

页码：94 / 107

页数：14

共 17 条

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