CONTINUOUS OBSERVATION OF ANNEALING PROCESSES IN COLD-WORKED ALUMINUM BY HIGH-VOLTAGE ELECTRON MICROSCOPY

被引:33
作者
FUJITA, H
机构
[1] Osaka University, Osaka, Yamada-kami, Suita-shi
关键词
D O I
10.1143/JPSJ.26.1437
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Recovery and recrystallization processes have been continuously observed with a 500 kV electron microscope on cold-worked aluminum foils which are sufficiently thick to cause the same phenomena as in bulk specimens. When the specimens are annealed, many of tangled dislocations become loose and form sub-boundaries at different portions from the cell walls in general. Subsequently, the subgrains grow one after the other. In these processes, attractive force of dislocation arrays on each individual composite-dislocation of other sub-boundaries plays an important role, so that the composite-dislocations of sub-boundaries with low dislocation density are generally absorbed into the neighboring sub-boundaries with higher dislocation density. At the same time, the sub-boundaries migrate by the line-tension of neighboring sub-boundaries. Through these processes, new high-angle boundaries, i.e., so-called recrystallization boundaries, are formed. © 1969, THE PHYSICAL SOCIETY OF JAPAN. All rights reserved.
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页码:1437 / &
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