RESISTIVITY OF EPITAXIAL FILMS OF SILVER WITH CONTROLLED SURFACE ROUGHNESS

被引：5

作者：

BERMAN, A

机构：

来源：

关键词：

D O I：

10.1063/1.1653473

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：415 / &

共 10 条

[1]

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[2]

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[3]

CAMPBELL DS, 1966, USE THIN FILMS PHYSI, P314

[4]

CHOPRA KL, 1967, J APPL PHYS, V38, P144

[5]

HALL LA, 1968, NBS365 TECHN NOT

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[8] A NEW THEORY OF SIZE EFFECT IN ELECTRICAL CONDUCTION [J].

PARROTT, JE .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1965, 85 (548P) :1143-&

[9] MEAN FREE PATHS OF ELECTRONS IN EVAPORATED METAL FILMS [J].

REYNOLDS, FW ;

STILWELL, GR .

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WHITE, GK ;

WOODS, SB .