MECHANISM OF INTERGRANULAR CORROSION OF AL-CU ALLOYS

[1] AKIMOV GV, 1957, THEORIES METHODES ES, P291

[2] AMMAR AI, 1968, ELECTROCHIM ACTA, V13, P781

[3] ENVIRONMENTAL FACTORS AFFECTING CRITICAL PITTING POTENTIAL OF ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (07) : 906 - &

[4] MICROSEGREGATION AND TENDENCY FOR PITTING CORROSION IN HIGH-PURITY ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (08) : 773 - &

[5] BURGER FJ, 1955, B I METALS, V3, P6

[6] COLNER WH, 1958, J ELECTROCHEM SOC, V105, P377

[7] DEMICHELI SMD, IN PRESS

[8] TECHNIQUE FOR A SCANNING ELECTRON MICROSCOPE STUDY OF ETCHED ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (07) : 1050 - &

[9] EDELEANU C, 1960, J I MET, V89, P90

[10] ENGELL HJ, 1959, ARCH EISENHUTTENWES, V30, P239

[1] AKIMOV GV, 1957, THEORIES METHODES ES, P291

[2] AMMAR AI, 1968, ELECTROCHIM ACTA, V13, P781

[3] ENVIRONMENTAL FACTORS AFFECTING CRITICAL PITTING POTENTIAL OF ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (07) : 906 - &

[4] MICROSEGREGATION AND TENDENCY FOR PITTING CORROSION IN HIGH-PURITY ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (08) : 773 - &

[5] BURGER FJ, 1955, B I METALS, V3, P6

[6] COLNER WH, 1958, J ELECTROCHEM SOC, V105, P377

[7] DEMICHELI SMD, IN PRESS

[8] TECHNIQUE FOR A SCANNING ELECTRON MICROSCOPE STUDY OF ETCHED ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (07) : 1050 - &

[9] EDELEANU C, 1960, J I MET, V89, P90

[10] ENGELL HJ, 1959, ARCH EISENHUTTENWES, V30, P239