SCANNING AUGER AND WORK-FUNCTION MEASUREMENTS APPLIED TO DISPENSER CATHODES

[1] ASCARELLI P, 1974, J ELECTRON SPECTRY R, V5, P717

[2] CORBIN RL, 1980, THESIS CALIFORNIA ST

[3] WORK FUNCTION MEASUREMENTS BY X-PE SPECTROSCOPY, AND THEIR RELEVANCE TO CALIBRATION OF X-PE SPECTRA [J]. CHEMICAL PHYSICS LETTERS, 1973, 23 (01) : 134 - 138

[4] ATTENUATION LENGTH AND ESCAPE DEPTH OF EXCITED ELECTRONS IN SOLIDS [J]. SURFACE SCIENCE, 1978, 75 (02) : 267 - 278

[5] FOMENKO VS, 1972, JPRS56579 NAT TECHN

[6] ELECTRON BEAM SCANNING TECHNIQUE FOR MEASURING SURFACE WORK FUNCTION VARIATIONS [J]. SURFACE SCIENCE, 1966, 4 (01) : 64 - &

[7] HAAS GA, 1972, TECHNIQUES METALS 1, V6

[8] HIGH SPATIAL-RESOLUTION SURFACE-POTENTIAL MEASUREMENTS USING SECONDARY ELECTRONS [J]. SURFACE SCIENCE, 1980, 93 (2-3) : 453 - 470

[9] NOTTINGHAM WB, 1956, MIT321 RES LAB EL TE

[10] WOLFF PA, 1964, PHYS REV, V95, P55

[1] ASCARELLI P, 1974, J ELECTRON SPECTRY R, V5, P717

[2] CORBIN RL, 1980, THESIS CALIFORNIA ST

[3] WORK FUNCTION MEASUREMENTS BY X-PE SPECTROSCOPY, AND THEIR RELEVANCE TO CALIBRATION OF X-PE SPECTRA [J]. CHEMICAL PHYSICS LETTERS, 1973, 23 (01) : 134 - 138

[4] ATTENUATION LENGTH AND ESCAPE DEPTH OF EXCITED ELECTRONS IN SOLIDS [J]. SURFACE SCIENCE, 1978, 75 (02) : 267 - 278

[5] FOMENKO VS, 1972, JPRS56579 NAT TECHN

[6] ELECTRON BEAM SCANNING TECHNIQUE FOR MEASURING SURFACE WORK FUNCTION VARIATIONS [J]. SURFACE SCIENCE, 1966, 4 (01) : 64 - &

[7] HAAS GA, 1972, TECHNIQUES METALS 1, V6

[8] HIGH SPATIAL-RESOLUTION SURFACE-POTENTIAL MEASUREMENTS USING SECONDARY ELECTRONS [J]. SURFACE SCIENCE, 1980, 93 (2-3) : 453 - 470

[9] NOTTINGHAM WB, 1956, MIT321 RES LAB EL TE

[10] WOLFF PA, 1964, PHYS REV, V95, P55