TEMPERATURE-DEPENDENCE OF X-RAY PHOTOELECTRON DIFFRACTION FROM COPPER - SURFACE AND BULK EFFECTS

被引：40

作者：

TREHAN, R

FADLEY, CS

机构：

来源：

PHYSICAL REVIEW B | 1986年 / 34卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.34.6784

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6784 / 6798

页数：15

共 49 条

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