APPLICATION OF LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY TO SUPERCONDUCTORS

被引：83

作者：

CLEM, JR

HUEBENER, RP

机构：

[1] IOWA STATE UNIV SCI & TECHNOL,DEPT PHYS,AMES,IA 50011

[2] UNIV TUBINGEN,INST PHYS,D-7400 TUBINGEN 1,FED REP GER

来源：

JOURNAL OF APPLIED PHYSICS | 1980年 / 51卷 / 05期

关键词：

D O I：

10.1063/1.327939

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2764 / 2773

页数：10

共 24 条

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[8] VOLTAGE MEASUREMENTS WITHIN NONEQUILIBRIUM REGION NEAR PHASE-SLIP CENTERS [J].

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[9] REGIMES IN BEHAVIOR OF SUPERCONDUCTING MICROBRIDGES [J].

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[10]

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