IMPROVEMENT OF ELECTRONIC SPECKLE FRINGES BY ADDITION OF INCREMENTAL IMAGES

被引:12
作者
FLOUREUX, T
机构
[1] The author is at the Swiss Federal Institute of Technology, Institute of Design and Manufacturing Methods
关键词
PHASE SHIFTING SPECKLE INTERFEROMETRY; ESPI; ADDITIONAL IMAGE PROCESSING;
D O I
10.1016/0030-3992(93)90120-5
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The phase fringes produced by a series of small incremental deformations are digitally added together to obtain fringes representing the total deformation. The development of such an interferometric method to improve the quantity and quality of phase fringes using a phase shifting speckle interferometer in the measurement of solid deformation is reported
引用
收藏
页码:255 / 258
页数:4
相关论文
共 7 条
[1]  
[Anonymous], 1983, HOLOGRAPHIC SPECKLE
[2]   PHASE-SHIFTER CALIBRATION IN PHASE-SHIFTING INTERFEROMETRY [J].
CHENG, YY ;
WYANT, JC .
APPLIED OPTICS, 1985, 24 (18) :3049-3052
[3]   PHASE-SHIFTING SPECKLE INTERFEROMETRY [J].
CREATH, K .
APPLIED OPTICS, 1985, 24 (18) :3053-3058
[4]  
CREATH K, 1988, PROGR OPTICS 26, V349
[5]  
KING R, 1989, DIGITAL FILTERING ON
[6]   FRINGE SCANNING SPECKLE-PATTERN INTERFEROMETRY [J].
NAKADATE, S ;
SAITO, H .
APPLIED OPTICS, 1985, 24 (14) :2172-2180
[7]   HOLOGRAPHIC SURFACE CONTOURING USING WAVELENGTH MODULATION OF LASER-DIODES [J].
TATAM, RP ;
DAVIES, JC ;
BUCKBERRY, CH ;
JONES, JDC .
OPTICS AND LASER TECHNOLOGY, 1990, 22 (05) :317-321