MICROSTRUCTURE OF THE INFINITE-LAYER STRUCTURAL SR1-XCUO2-DELTA THIN-FILMS

被引:17
作者
SUGII, N
ICHIKAWA, M
HAYASHI, K
KUBO, K
YAMAMOTO, K
YAMAUCHI, H
机构
[1] Superconductivity Research Laboratory, International Superconductivity Technology Center, Koto-ku, Tokyo, 135
来源
PHYSICA C | 1993年 / 213卷 / 3-4期
关键词
D O I
10.1016/0921-4534(93)90451-U
中图分类号
O59 [应用物理学];
学科分类号
摘要
The microstructure of Sr1-xCuO2-delta thin films with x=0.00 and 0.10 was investigated by X-ray diffraction and transmission electron microscopy. Both films were single phase of the ''infinite-layer'' structure. However, in both films certain defects were observed, being extended along the ac-plane. The defect was found to be intergrown Sr2CuO3 crystallites between the infinite-layer structure Sr1-xCuO2-delta crystals. It was suspected that one of the reasons why superconductivity was not observed in these films was that Sr-deficient ab-planes were not observed in these film samples.
引用
收藏
页码:345 / 352
页数:8
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