USE OF XPS TO DETECT VARIATIONS IN DISPERSION OF IMPREGNATED AND ION-EXCHANGED NIO-SIO2 SYSTEMS

被引：11

作者：

HOUALLA, M ^{[1
]}

DELMON, B ^{[1
]}

机构：

[1] CATHOLIC UNIV LOUVAIN,PHYS CHIM MINERAL & CATALYSE GRP,B-1348 LOUVAIN LA NEUVE,BELGIUM

来源：

SURFACE AND INTERFACE ANALYSIS | 1981年 / 3卷 / 03期

关键词：

D O I：

10.1002/sia.740030302

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：103 / 105

页数：3

共 14 条

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