FREQUENCY-DEPENDENCE OF THE EPR LINEWIDTH IN THE DISORDERED ONE DIMENSIONAL SYSTEM TMMC DOPED WITH CU

被引：4

作者：

IBRUGGER, J ^{[1
]}

SIEGEL, E ^{[1
]}

LAGENDIJK, A ^{[1
]}

机构：

[1] UNIV INSTELLING ANTWERP,DEPT NATUURKUNDE,B-2610 WILRIJK,BELGIUM

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1979年 / 13卷 / 1-2期

关键词：

D O I：

10.1016/0304-8853(79)90039-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The EPR linewidth of Cu doped TMMC crystals was determined at 300 K in the frequency range 1.5-18 GHz. The linewidths of the doped samples show a v- 1 2 dependence at the magic angle just as in the case of the pure one. This is a direct experimental proof that the dynamic of this disordered system is one-dimensional diffusive. © 1979.

引用

页码：107 / 109

页数：3

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