AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES

被引:76
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MACDONALD, NC
WALDROP, JR
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D O I
10.1063/1.1653933
中图分类号
O59 [应用物理学];
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页码:315 / +
页数:1
相关论文
共 6 条
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MacDonald N. C., 1970, Applied Physics Letters, V16, P76, DOI 10.1063/1.1653107
[2]  
MACDONALD NC, 1970, 3 P ANN SCANN EL MIC, P27
[3]  
MACDONALD NC, 1971, 4 P ANN SCANN EL MIC, P89
[4]   HIGH SENSITIVITY AUGER ELECTRON SPECTROMETER [J].
PALMBERG, PW ;
BOHN, GK ;
TRACY, JC .
APPLIED PHYSICS LETTERS, 1969, 15 (08) :254-&
[5]   AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J].
PALMBERG, PW ;
RHODIN, TN .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) :2425-&
[6]  
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