LIMITATIONS AND IMPROVEMENTS OF TRACE-ELEMENT ANALYSIS WITH PROTON-INDUCED X-RAYS

被引:9
作者
VERBA, JW [1 ]
SUNIER, JW [1 ]
WRIGHT, BT [1 ]
SLAUS, I [1 ]
HOLMAN, AB [1 ]
KULLECK, JG [1 ]
机构
[1] UNIV CALIF,DEPT PHYS,LOS ANGELES,CA 90024
来源
JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1972年 / 12卷 / 01期
关键词
D O I
10.1007/BF02520986
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:171 / 179
页数:9
相关论文
共 6 条
[1]   X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J].
JOHANSSON, TB ;
AKSELSSON, R ;
JOHANSSON, SA .
NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01) :141-+
[2]  
LOWES R, KEVEX CORP TECHNICAL
[3]  
Merzbacher E., 1958, HDB PHYSIK, V34, P166
[4]   X-RAY EMISSION INDUCED BY 30 TO 80 MEV ALPHA PARTICLES [J].
WATSON, RL ;
LEWIS, CW ;
NATOWITZ, JB .
NUCLEAR PHYSICS A, 1970, A154 (03) :561-&
[5]   INVESTIGATION OF ANALYTICAL CAPABILITIES OF X-RAY EMISSION INDUCED BY HIGH ENERGY ALPHA PARTICLES [J].
WATSON, RL ;
SJURSETH, JR ;
HOWARD, RW .
NUCLEAR INSTRUMENTS & METHODS, 1971, 93 (01) :69-&
[6]  
WATSON RL, 1970, RESEARCH OPERATION T, P72