ANGULAR-DISTRIBUTIONS OF AUGER ELECTRONS FROM SURFACES - CONCLUSIONS FROM FULL MULTIPLE-SCATTERING SIMULATIONS

被引:15
作者
CHEN, X [1 ]
HARP, GR [1 ]
SALDIN, DK [1 ]
机构
[1] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53211
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1994年 / 12卷 / 02期
关键词
D O I
10.1116/1.579259
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We address some of the recent controversies regarding the interpretation of Auger electron diffraction patterns by simulating those from the 64 eV M2,3VV and the 914 eV L3VV lines from a Cu(001) surface. The lower-energy diffraction pattern, in particular, is found to be strongly dependent on the angular momentum l of the emitted Auger electrons, in line with the observations of some other authors. However, we find that both peaks and dips are observed on the same diffraction pattern at the projections of different atomic rows, indicating that the angular momentum of the source wave cannot be the only determinant of these features. We find that the distance of the scatterer from the source, as well as overlap and interference effects from scatterers in other atomic rows to be an equally important determining factor. On comparing our simulations with experimental diffraction patterns, we find that, for an l = 3 source wave, our simulations agree remarkably well with the data from both Auger lines.
引用
收藏
页码:428 / 435
页数:8
相关论文
共 21 条
[1]   ANGULAR RESOLVED AUGER EMISSION FROM CRYSTAL-SURFACES - NEW EXPERIMENTAL RESULTS AND PREDICTIONS FROM A SIMPLE-MODEL [J].
ABERDAM, D ;
BAUDOING, R ;
BLANC, E ;
GAUBERT, C .
SURFACE SCIENCE, 1978, 71 (02) :279-305
[2]   SOURCE-WAVE ANGULAR-MOMENTUM EFFECTS ON ELECTRON-DIFFRACTION PATTERNS [J].
BARTON, JJ ;
TERMINELLO, LJ .
PHYSICAL REVIEW B, 1992, 46 (20) :13548-13552
[3]   DETERMINATION OF EPITAXIAL OVERLAYER STRUCTURES FROM HIGH-ENERGY ELECTRON-SCATTERING AND DIFFRACTION [J].
BULLOCK, EL ;
FADLEY, CS .
PHYSICAL REVIEW B, 1985, 31 (02) :1212-1215
[4]   EPITAXIAL FILM CRYSTALLOGRAPHY BY HIGH-ENERGY AUGER AND X-RAY PHOTOELECTRON DIFFRACTION [J].
CHAMBERS, SA .
ADVANCES IN PHYSICS, 1991, 40 (04) :357-415
[5]  
CHAMBERS SA, 1992, SURF SCI REP, V16, P263
[6]  
CHERKENDORFF I, 1983, J ELECTRON SPECTROSC, V32, P1
[7]  
DAVIS HL, 1977, 7TH P INT VAC C 3RD, V30
[8]   X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD SCATTERING - A NEW TOOL FOR SURFACE CRYSTALLOGRAPHY [J].
EGELHOFF, WF .
CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1990, 16 (03) :213-235
[9]  
FADLEY CS, 1990, SYNCHROTRON RAD RES
[10]   DIRECT IMAGING OF MONOLAYER AND SURFACE ATOMIC-STRUCTURE BY ANGULAR-DISTRIBUTION AUGER MICROSCOPY [J].
FRANK, DG ;
GOLDEN, T ;
CHYAN, OMR ;
HUBBARD, AT .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03) :1254-1260