HIGH-RESOLUTION MAGNETIC IMAGING OF DOMAINS IN TBFE BY FORCE MICROSCOPY

被引：149

作者：

MARTIN, Y ^{[1
]}

RUGAR, D ^{[1
]}

WICKRAMASINGHE, HK ^{[1
]}

机构：

[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 03期

关键词：

D O I：

10.1063/1.99482

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：244 / 246

页数：3

相关论文

共 6 条

[1] ATOMIC FORCE MICROSCOPE
BINNIG, G
QUATE, CF
GERBER, C
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[2] CELLOTA RJ, 1986, SCIENCE, V234, P333
[3] MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION
MARTIN, Y
WICKRAMASINGHE, HK
[J]. APPLIED PHYSICS LETTERS, 1987, 50 (20) : 1455 - 1457
[4] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE
MARTIN, Y
WILLIAMS, CC
WICKRAMASINGHE, HK
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) : 4723 - 4729
[5] REIMER L, 1984, SPRINGER SERIES OPTI, V36
[6] OBSERVATION OF LASER-WRITTEN MAGNETIC DOMAINS IN AMORPHOUS TBFE FILMS BY LORENTZ MICROSCOPY
SUITS, JC
GEISS, RH
LIN, CJ
RUGAR, D
BELL, AE
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (08) : 3509 - 3513