SHEATH EXPANSION OF PLANE PROBE BY ION-BEAM REFLECTION

[1] ELECTROSTATIC ION-CYCLOTRON INSTABILITY DRIVEN BY A DEFLECTED ION-BEAM [J]. PHYSICS LETTERS A, 1980, 78 (01) : 79 - 81

[2] CHAN C, 1980, IEEE INT C PLASMA SC

[3] Chen F.F., 1965, PLASMA DIAGNOSTIC TE, DOI DOI 10.1017/S0022377800003160

[4] NORMAL MODES IN ION-BEAM - PLASMA SYSTEM [J]. PHYSICAL REVIEW LETTERS, 1975, 34 (02) : 77 - 80

[5] PLASMA POTENTIAL MEASUREMENTS BY ELECTRON EMISSIVE PROBES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (04) : 455 - &

[6] GUARDRING PROBES IN HOT-CATHODE HG-VAPOR DISCHARGES [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (01) : 215 - &

[7] PERTURBATION OF PLASMA POTENTIAL CAUSED BY PROBE OR GRID IN A PLASMA [J]. PHYSICS LETTERS A, 1978, 65 (5-6) : 415 - 417

[8] OBSERVATION OF ELECTRON-ION INSTABILITY IN COUNTERSTREAMING ION-BEAMS AND PLASMA SYSTEM [J]. PHYSICAL REVIEW LETTERS, 1977, 39 (25) : 1622 - 1625

[9] NAKAMURA Y, UNPUBLISHED

[10] SASAKI S, 1978, ISAS RES NOTE, V62

[1] ELECTROSTATIC ION-CYCLOTRON INSTABILITY DRIVEN BY A DEFLECTED ION-BEAM [J]. PHYSICS LETTERS A, 1980, 78 (01) : 79 - 81

[2] CHAN C, 1980, IEEE INT C PLASMA SC

[3] Chen F.F., 1965, PLASMA DIAGNOSTIC TE, DOI DOI 10.1017/S0022377800003160

[4] NORMAL MODES IN ION-BEAM - PLASMA SYSTEM [J]. PHYSICAL REVIEW LETTERS, 1975, 34 (02) : 77 - 80

[5] PLASMA POTENTIAL MEASUREMENTS BY ELECTRON EMISSIVE PROBES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (04) : 455 - &

[6] GUARDRING PROBES IN HOT-CATHODE HG-VAPOR DISCHARGES [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (01) : 215 - &

[7] PERTURBATION OF PLASMA POTENTIAL CAUSED BY PROBE OR GRID IN A PLASMA [J]. PHYSICS LETTERS A, 1978, 65 (5-6) : 415 - 417

[8] OBSERVATION OF ELECTRON-ION INSTABILITY IN COUNTERSTREAMING ION-BEAMS AND PLASMA SYSTEM [J]. PHYSICAL REVIEW LETTERS, 1977, 39 (25) : 1622 - 1625

[9] NAKAMURA Y, UNPUBLISHED

[10] SASAKI S, 1978, ISAS RES NOTE, V62