PHOTOIONIZATION THRESHOLD OF CS2 IN SOLID NEON

被引：10

作者：

CHENG, BM ^{[1
]}

LO, WJ ^{[1
]}

HUNG, WC ^{[1
]}

机构：

[1] NATL TSING HUA UNIV,DEPT CHEM,HSINCHU 30043,TAIWAN

来源：

CHEMICAL PHYSICS LETTERS | 1995年 / 236卷 / 03期

关键词：

D O I：

10.1016/0009-2614(95)00224-R

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The photoionization threshold of CS2 in solid neon was determined via photoionization of a CS2/Ne sample in situ at 5 K. The source of light for ionization was conducted from synchrotron radiation. The increase of fluorescent intensity of the cation CS2+ was measured by means of a laser-induced fluorescence scheme. A threshold energy 10.31 +/- 0.02 eV was found for photoionization of CS, in solid neon. Relative to the ionization energy in the gas phase this value corresponds to an additional barrier 0.24 eV due to the matrix cage. Hence the ejected electron needs 0.24 eV excess kinetic energy to escape the matrix cage.

引用

页码：355 / 361

页数：7

共 28 条

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