MEASUREMENT OF VARIATION OF FREQUENCY WITH AMBIENT TEMPERATURE OF MICROWAVE SEMICONDUCTOR OSCILLATORS

被引：6

作者：

HOBSON, GS

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1970年 / 3卷 / 10期

关键词：

D O I：

10.1088/0022-3735/3/10/314

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：801 / &

相关论文

共 3 条

[1] AN AUTOMATIC EQUIPMENT FOR RECORDING FREQUENCY VARIATION OF X-BAND OSCILLATORS WITH TEMPERATURE OVER RANGE-40 TO +70 DEGREES C WITH PARTICULAR REFERENCE TO GUNN OSCILLATORS
HOBSON, GS
WARNER, FL
[J]. RADIO AND ELECTRONIC ENGINEER, 1970, 39 (06): : 316 - +
[2] HOBSON GS, 1970, MICROWAVE J, V13, P46
[3] WARNER FL, 1967, 1 P CORN BIENN C ENG, P206