MODELING OF LOW-LEVEL RECTIFICATION RFI IN BIPOLAR CIRCUITRY

被引:23
作者
RICHARDSON, RE
机构
[1] U.S. Naval Surface Weapons Center, Dahlgren
关键词
comparison with measurements; Low-frequency bipolar circuitry; low-level rectification; microwave energy; model;
D O I
10.1109/TEMC.1979.303771
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper discusses the rectification response exhibited by low-frequency bipolar transistors when microwave energy is injected. A circuit-analysis model for calculating low-frequency small-signal RFI response is outlined and applied in analyzing RFI behavior of a 741 op amp. Principal results from the RFI-device model are 1) RFI is due basically to nonlinearity of the emitter-base characteristic, and also to ac crowding and nonuniformity of gain across the emitter, and 2) there is a distinct inverse relationship between device size (emitter perimeter) and rectification-RFI sensitivity. Model results and comparison with 741 op amp measurements indicate that the rectification sensitivity to 1-GHz power is approximately 3 mV of offset voltage referred to the device input, per microwatt of absorbed power. Copyright © 1979 by the Institute of Electrical and Electronics Engineers, Inc.
引用
收藏
页码:307 / 311
页数:5
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