ELEMENTAL ANALYSIS OF THICK OBSIDIAN SAMPLES BY PROTON-INDUCED X-RAY-EMISSION SPECTROMETRY

被引：24

作者：

DUERDEN, P

COHEN, DD

CLAYTON, E

BIRD, JR

AMBROSE, WR

LEACH, BF

机构：

[1] AUSTRALIAN NATL UNIV,RES SCH PACIF STUDIES,DEPT PREHIST,CANBERRA 2600,ACT,AUSTRALIA

[2] UNIV OTAGO,DEPT ANTHROPOL,DUNEDIN,NEW ZEALAND

来源：

ANALYTICAL CHEMISTRY | 1979年 / 51卷 / 14期

关键词：

D O I：

10.1021/ac50050a014

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Proton induced X-ray emission is shown to be suitable for the analysis of thick obsidian samples and artifacts with no special treatment other than washing prior to mounting in a sample chamber vacuum system. X-ray spectra observed unfiltered and with plastic or pinhole filters are compared. Using a pinhole filter and a single measurement of approximately 4-min duration followed by thick target yield calculations, a fit to the observed spectra gives concentrations of such elements as K, Ca, Ti, V, Mn, Fe, Rb, Y, Sr, Zr, Nb, Ta, Pb. Results for selected source samples from the Pacific region show that the technique provides a suitable method for distinguishing between many of the sources. © 1979, American Chemical Society. All rights reserved.

引用

页码：2350 / 2354

页数：5

共 8 条

[1] BIRD JR, 1978, ANAL CHEM, V50, P2082, DOI 10.1021/ac50036a035
[2] COHEN DD, 1979, E468 AUST AT EN COMM
[3] LIEBERT RB, 1973, PHYS REV A, V8, P236
[4] NEILSEN KK, 1976, ANAL CHEM, V48, P1947
[5] QUANTITATIVE-ANALYSIS OF COMPLEX TARGETS BY PROTON-INDUCED X-RAYS
REUTER, W
LURIO, A
CARDONE, F
ZIEGLER, JF
[J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) : 3194 - 3202
[6] Smith I., 1977, Archaeology and Physical Anthropology in Oceania, V12, P173
[7] Taylor RE., 1976, Advances in obsidian glass studies: Archaeological and geochemical perspectives
[8] WILLIS RD, 1977, NUCL INSTRUM METHODS, V141, P231

← 1 →