PICOSECOND BACKSIDE OPTICAL-DETECTION OF INTERNAL SIGNALS IN FLIP-CHIP MOUNTED SILICON VLSI CIRCUITS

被引：9

作者：

HEINRICH, HK

PAKDAMAN, N

PRINCE, JL

KENT, DS

CROPP, LM

机构：

[1] IBM T.J. Watson Research Center, Yorktown Heights, NY

[2] IBM General Technology Division, Hopewell Junction, NY

来源：

MICROELECTRONIC ENGINEERING | 1992年 / 16卷 / 1-4期

关键词：

23;

D O I：

10.1016/0167-9317(92)90352-R

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present picosecond backside optical measurements of currents and voltages, propagation delays, and glitches in flip-chip mounted silicon IC's. These signals are shown to compare well with prior circuit simulations, but they showed additional features not easily simulated.

引用

页码：313 / 324

页数：12

共 23 条

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