USE OF SILICON MICROSTRIP DETECTORS FOR PRECISE MEASUREMENT OF HIGH MOMENTA

被引:17
作者
ARMSTRONG, TA
BENAYOUN, M
BEUSCH, W
BLOODWORTH, IJ
CAPONERO, M
CARNEY, JN
CHILDS, R
FRENCH, BR
GHIDINI, B
GOLDSCHMIDTCLERMONT, Y
JACHOLKOWSKI, A
KAHANE, J
KINSON, JB
KIRK, A
LENTI, V
LERUSTE, P
MALAMANT, A
NARJOUX, JL
NAVACH, F
PALANO, A
QUERCIGH, E
REDAELLI, N
ROSSI, L
SENE, M
SENE, R
SHAYLOR, HR
STASSINAKI, M
TRAINOR, MT
VASSILIADIS, G
BAILLIE, OV
VOTRUBA, MF
ZITO, G
ZITOUN, R
机构
[1] CERN, CH-1211 GENEVA 23, SWITZERLAND
[2] IST NAZL FIS NUCL, BARI, ITALY
[3] UNIV BARI, DEPARTIMENTO FIS, I-70124 BARI, ITALY
[4] UNIV ATHENS, DEPT PHYS, ATHENS, GREECE
[5] UNIV PARIS 07, F-75221 PARIS 05, FRANCE
[6] COLL FRANCE, F-75231 PARIS 05, FRANCE
[7] UNIV PARIS 06, LPNHE, PARIS, FRANCE
关键词
D O I
10.1016/0168-9002(89)90374-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:165 / 170
页数:6
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