COMPENSATED POLARIZATION SCRAMBLER FOR RAMAN DEPOLARIZATION AND INTENSITY MEASUREMENTS ON MICROSAMPLES

被引：10

作者：

BAILEY, GF

SCHERER, JR

机构：

[1] Western Regional Research Laboratory Agricultural Research Service, U.S. Department of Agriculture, Albany

来源：

关键词：

microsampling; Raman depolarization; spectrometer polarization;

D O I：

10.1080/00387016908050206

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

[No abstract available]

引用

页码：261 / &

共 12 条

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[3] SMALL SAMPLE HANDLING IN LASER RAMAN SPECTROMETRY
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[J]. ANALYTICAL CHEMISTRY, 1969, 41 (02) : 398 - &
[4] HANLE W, 1931, Z INSTRUMENTENKD, V51, P488
[5] QUARTER-WAVE RETARDATION SYSTEMS BASED ON FRESNEL RHOMB PRINCIPLE
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[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1966, 43 (09): : 617 - &
[6] KRASILOV YI, 1967, OPT SPECTROSC-USSR, V22, P267
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[8] SCHERER JR, IN PRESS
[9] STAMM RF, 1945, ANAL CHEM, V17, P318
[10] The analysis of the Raman spectra of Si2Cl6(l) and of Si2H6(g)
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Yost, DM
[J]. JOURNAL OF CHEMICAL PHYSICS, 1937, 5 (02) : 90 - 96