CORE ABSORPTION-SPECTRA OF CRYSTALLINE AND AMORPHOUS GETE THIN-FILMS

被引:9
作者
FUKUI, K
SAITO, T
KONDO, S
FUJII, Y
SAKISAKA, Y
WATANABE, M
机构
[1] FUKUI UNIV,FAC ENGN,DEPT APPL PHYS,FUKUI 910,JAPAN
[2] OSAKA CITY UNIV,FAC SCI,DEPT APPL PHYS,OSAKA 558,JAPAN
[3] KYOTO UNIV,FAC SCI,DEPT CHEM,KYOTO 606,JAPAN
[4] INST MOLEC SCI,ULTRAVIOLET SYNCHROTRON ORBITAL RADIAT FACIL,OKAZAKI,AICHI 444,JAPAN
关键词
amorphous; band structure; core exciton; covalency; degenerate semiconductor; Ge 3d level; GeTe; Te 4d level;
D O I
10.1143/JPSJ.59.4161
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Core absorption spectra of crystalline (c-) and amorphous (a-) GeTe thin films have been measured in the 26-70 eV region. Photoemission spectra have also been measured to determine the binding energies of Ge 3d and Te 4d core levels. In the c-phase Ge 3d absorption shows excitonic peaks which can be explained in atomic picture, while Te 4d absorption shows broad structures which reflect DOS of the conduction band. A small peak was found below the broad structures of Te 4d absorption, the origin of which is the excitonic transition or the transition to the hole states generated by Ge vacancies located near the top of the valence band. In the a-phase Ge 3d absorption shows a broad structure while Te 4d absorption somewhat sharp doublet. The difference in the spectral features in both phases suggests that the bonding character is more covalent in a-GeTe than in c-GeTe. © 1990, THE PHYSICAL SOCIETY OF JAPAN. All rights reserved.
引用
收藏
页码:4161 / 4168
页数:8
相关论文
共 24 条
[1]   STRUCTURE OF AMORPHOUS GEXTE1-X SYSTEMS [J].
AGGARWAL, K ;
MENDIRATTA, RG ;
KAMAL, R .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1977, 23 (03) :357-361
[2]   AMORPHOUS VERSUS CRYSTALLINE GETE FILMS .3. ELECTRICAL PROPERTIES AND BAND STRUCTURE [J].
BAHL, SK ;
CHOPRA, KL .
JOURNAL OF APPLIED PHYSICS, 1970, 41 (05) :2196-&
[3]   AMORPHOUS VERSUS CRYSTALLINE GETE FILMS .2. OPTICAL PROPERTIES [J].
BAHL, SK ;
CHOPRA, KL .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (12) :4940-&
[4]  
Bilz H., 1983, SPRINGER TRACTS MODE, V99
[5]   PROPERTIES OF THIN FILMS OF PBTE AND SNTE DEPOSITED AT TEMPERATURES BETWEEN 4.2 DEGREES AND 300 DEGREES K [J].
BROWN, RW ;
MILLNER, AR ;
ALLGAIER, RS .
THIN SOLID FILMS, 1970, 5 (03) :157-&
[6]   AMORPHOUS VERSUS CRYSTALLINE GETE FILMS .I. GROWTH AND STRUCTURAL BEHAVIOR [J].
CHOPRA, KL ;
BAHL, SK .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (10) :4171-&
[7]  
CONDON EU, 1964, THEORY ATOMIC SPECTR
[8]  
Dornhaus R., 1983, Narrow-gap semiconductors
[9]  
FRAGA S, 1979, ATOMIC ENERGY LEVELS
[10]   ABSORPTION-SPECTRA OF AMORPHOUS AND CRYSTALLINE SNTE THIN-FILMS IN THE 2-120 EV REGION [J].
FUKUI, K ;
YAMAZAKI, J ;
SAITO, T ;
KONDO, S ;
WATANABE, M .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1987, 56 (11) :4196-4197