MEASUREMENT OF THE SI-32 HALF-LIFE VIA ACCELERATOR MASS-SPECTROMETRY

被引：71

作者：

KUTSCHERA, W ^{[1
]}

HENNING, W ^{[1
]}

PAUL, M ^{[1
]}

SMITHER, RK ^{[1
]}

STEPHENSON, EJ ^{[1
]}

YNTEMA, JL ^{[1
]}

ALBURGER, DE ^{[1
]}

CUMMING, JB ^{[1
]}

HARBOTTLE, G ^{[1
]}

机构：

[1] BROOKHAVEN NATL LAB, UPTON, NY 11973 USA

来源：

关键词：

D O I：

10.1103/PhysRevLett.45.592

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：592 / 596

页数：5

共 19 条

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[5] HALF-LIFE OF SI-32 FROM TANDEM-ACCELERATOR MASS-SPECTROMETRY
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[9] HENNING W, UNPUBLISHED
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