ERROR ANALYSIS OF SYNCANG AND SYNCWANG METHODS FOR MEASUREMENT OF FILM REFRACTIVE-INDEX AND THICKNESS

[1] Kersten R. Th., 1973, Optics Communications, V9, P427, DOI 10.1016/0030-4018(73)90288-5

[2] KERSTEN RT, 1975, OPT ACTA, V22, P503, DOI 10.1080/713819078

[3] SUEMATSU Y, 1972, T I ELECTRON COMMU C, V55, P98

[4] THEORY OF PRISM-FILM COUPLER AND THIN-FILM LIGHT GUIDES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (10) : 1325 - &

[5] MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMS [J]. APPLIED PHYSICS LETTERS, 1969, 14 (09) : 291 - &

[6] MEASUREMENT OF THIN-FILM PARAMETERS WITH A PRISM COUPLER [J]. APPLIED OPTICS, 1973, 12 (12): : 2901 - 2908

[7] SYNCANG METHOD FOR SIMULTANEOUS MEASUREMENT OF FILM REFRACTIVE-INDEX AND THICKNESS [J]. THIN SOLID FILMS, 1974, 23 (02) : 153 - 160

[8] WALTER DJ, 1974, THESIS LONDON U

[1] Kersten R. Th., 1973, Optics Communications, V9, P427, DOI 10.1016/0030-4018(73)90288-5

[2] KERSTEN RT, 1975, OPT ACTA, V22, P503, DOI 10.1080/713819078

[3] SUEMATSU Y, 1972, T I ELECTRON COMMU C, V55, P98

[4] THEORY OF PRISM-FILM COUPLER AND THIN-FILM LIGHT GUIDES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (10) : 1325 - &

[5] MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMS [J]. APPLIED PHYSICS LETTERS, 1969, 14 (09) : 291 - &

[6] MEASUREMENT OF THIN-FILM PARAMETERS WITH A PRISM COUPLER [J]. APPLIED OPTICS, 1973, 12 (12): : 2901 - 2908

[7] SYNCANG METHOD FOR SIMULTANEOUS MEASUREMENT OF FILM REFRACTIVE-INDEX AND THICKNESS [J]. THIN SOLID FILMS, 1974, 23 (02) : 153 - 160

[8] WALTER DJ, 1974, THESIS LONDON U