COHERENT MEASUREMENT OF THZ OPTICAL RECTIFICATION FROM ELECTROOPTIC CRYSTALS

被引：162

作者：

ZHANG, XC

JIN, Y

MA, XF

机构：

[1] Department of Physics, Rensselaer Polytechnic Institute, Troy

来源：

APPLIED PHYSICS LETTERS | 1992年 / 61卷 / 23期

关键词：

D O I：

10.1063/1.108083

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report the results of coherent measurement (phase and amplitude) of optical rectification from a variety of electro-optic crystals. We also present a comparison of the experimental data with a theoretical calculation.

引用

页码：2764 / 2766

页数：3

共 21 条

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