AN IMPROVED MODEL FOR PROTECTIVE-SYSTEM RELIABILITY

被引:69
作者
ANDERSON, PM
AGARWAL, SK
机构
[1] Power Math Associates Inc., San Diego, California 92130, 12625 High Bluff Drive
[2] Power Math Associates Inc., San Diego, California 92130, 12625 High Bluff Drive
关键词
PROTECTIVE SYSTEM; UNREADINESS PROBABILITY; UNDETECTED FAULT; FAILED-COMPONENT ISOLATION; MARKOV MODEL;
D O I
10.1109/24.159812
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A Markov model extends and improves previous models for determining the unreadiness probability and unavailability of a protective system, such as those found on power transmission & distribution systems. Improved definitions of unreadiness probability and other relevant measures are proposed, based on a new Markov model of the system. This new model provides a more direct and physically important definition of unreadiness, and can be computed based on typical system-transition rates. Using this model, it is possible to estimate the optimal value of the protection inspection interval, viz, the time between inspections of the protective system. The model accounts for the operation of backup protection, the removal of protection for inspection, the occurrence of common-cause failures, and the usual clearing of faults.
引用
收藏
页码:422 / 426
页数:5
相关论文
共 10 条
[1]   RELIABILITY MODELING OF PROTECTIVE SYSTEMS [J].
ANDERSON, PM .
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1984, 103 (08) :2207-2214
[2]   DETERMINING RELIABILITY OF PROTECTIVE RELAY SYSTEMS [J].
GRIMES, JD .
IEEE TRANSACTIONS ON RELIABILITY, 1970, R 19 (03) :82-&
[3]   GRAPH-THEORY CONCEPTS IN FREQUENCY AND AVAILABILITY ANALYSIS [J].
KUMAR, S ;
BILLINTON, R .
IEEE TRANSACTIONS ON RELIABILITY, 1985, 34 (04) :290-294
[4]   PROTECTION SYSTEM RELIABILITY MODELING - UNREADINESS PROBABILITY AND MEAN DURATION OF UNDETECTED FAULTS [J].
SINGH, C ;
PATTON, AD .
IEEE TRANSACTIONS ON RELIABILITY, 1980, 29 (04) :339-340
[5]  
SINGH C, 1980, NAPS03662C DOC
[6]  
1981, ANSIIEEE C371001981
[7]  
ANSIIEEE3521987 AM N
[8]  
ANSIIEEE3381987 AM N
[9]  
ANSIIEEE3791988 AM N
[10]  
ANSIIEEE6031980 AM N