ION TRAJECTORIES IN FIELD-ION MICROSCOPE

被引：8

作者：

GILLOTT, L ^{[1
]}

SUGDEN, J ^{[1
]}

机构：

[1] UNIV SHEFFIELD,DEPT PHYS,HICKS BLDG,SHEFFIELD S3 7RH,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1973年 / 6卷 / 12期

关键词：

D O I：

10.1088/0022-3735/6/12/025

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1218 / 1220

页数：3

共 11 条

[1]

ALLEN NDG, 1955, RELAXATION METHODS

[2]

BIRDSEYE PJ, 1972, THESIS U OXFORD

[3] ACCURATE DETERMINATION OF CRYSTAL ORIENTATION FROM FIELD ION MICROGRAPHS [J].

BRANDON, DG .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1964, 41 (06) :373-&

[4] THE FIELD EMITTER - FABRICATION, ELECTRON MICROSCOPY, AND ELECTRIC FIELD CALCULATIONS [J].

DYKE, WP ;

TROLAN, JK ;

DOLAN, WW ;

BARNES, G .

JOURNAL OF APPLIED PHYSICS, 1953, 24 (05) :570-576

[5]

FORTES MA, 1968, THESIS U CAMBRIDGE

[6]

GILLOT L, 1968, THESIS U CAMBRIDGE

[7] Further Observations with the Field Electron Microscope [J].

Mueller, Erwin W. .

ZEITSCHRIFT FUR PHYSIK, 1938, 108 (9-10) :668-680

[8]

Muller E W, 1969, FIELD ION MICROSCOPY

[9] A METHOD FOR INDEXING FIELD ION MICROGRAPHS [J].

NEWMAN, RW ;

SANWALD, RC ;

HREN, JJ .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (10) :828-&

[10] ON THE MAGNIFICATION AND RESOLUTION OF THE FIELD EMISSION ELECTRON MICROSCOPE [J].

ROSE, DJ .

JOURNAL OF APPLIED PHYSICS, 1956, 27 (03) :215-220

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