THE EFFECT OF PROFILE STEP WIDTH ON THE DETERMINATION OF CRYSTAL-STRUCTURE PARAMETERS AND ESTIMATED STANDARD DEVIATIONS BY X-RAY RIETVELD ANALYSIS

被引：59

作者：

HILL, RJ

MADSEN, IC

机构：

来源：

关键词：

D O I：

10.1107/S0021889886090076

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：10 / 18

页数：9

共 24 条

[1] [Anonymous], 1974, INT TABLES XRAY CRYS, VIV, p[99, 149]
[2] A NEUTRON POWDER DIFFRACTION STUDY OF DEUTERATED ALPHA-RESORCINOL AND BETA-RESORCINOL
BACON, GE
LISHER, EJ
[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1980, 36 (AUG): : 1908 - 1916
[3] COUNTING STATISTICS AND POWDER DIFFRACTION SCAN REFINEMENTS
BAHARIE, E
PAWLEY, GS
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (AUG) : 404 - 406
[4] AN ALTERNATIVE TO THE RIETVELD PROFILE REFINEMENT METHOD
COOPER, MJ
ROUSE, KD
SAKATA, M
[J]. ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1981, 157 (1-2): : 101 - 117
[5] THE VALIDITY OF THE RIETVELD METHOD
COOPER, MJ
[J]. ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1983, 164 (1-2): : 157 - 158
[6] DURBIN J, 1951, BIOMETRIKA, V38, P159, DOI 10.2307/2332325
[7] DURBIN J, 1950, BIOMETRIKA, V37, P409, DOI 10.1093/biomet/37.3-4.409
[8] TESTING FOR SERIAL-CORRELATION IN INTENSITY DATA
FLACK, HD
VINCENT, MG
VINCENT, JA
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1980, 36 (MAY): : 495 - 496
[9] PROFILE REFINEMENT OF SINGLE-CRYSTAL AND POWDER DATA - THE ACCURACY OF CRYSTALLOGRAPHIC PARAMETERS
HEWAT, AW
SABINE, TM
[J]. AUSTRALIAN JOURNAL OF PHYSICS, 1981, 34 (06): : 707 - 712
[10] THE EFFECT OF PROFILE STEP COUNTING TIME ON THE DETERMINATION OF CRYSTAL-STRUCTURE PARAMETERS BY X-RAY RIETVELD ANALYSIS
HILL, RJ
MADSEN, IC
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (OCT) : 297 - 306