PHOTOTHERMAL DEFLECTION TECHNIQUE FOR MEASURING THERMAL NONLINEARITIES IN SEMICONDUCTOR GLASSES

被引:16
作者
BERTOLOTTI, M
FERRARI, A
SIBILIA, C
SUBER, G
APOSTOL, D
JANI, P
机构
[1] CENT INST PHYS, R-76900 BUCHAREST, ROMANIA
[2] INST PHYS, BUDAPEST, HUNGARY
[3] UGO BORDONI FDN, ROME, ITALY
来源
APPLIED OPTICS | 1988年 / 27卷 / 09期
关键词
D O I
10.1364/AO.27.001811
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:1811 / 1813
页数:3
相关论文
共 9 条
[1]   SENSITIVE PHOTOTHERMAL DEFLECTION TECHNIQUE FOR MEASURING ABSORPTION IN OPTICALLY THIN MEDIA [J].
BOCCARA, AC ;
FOURNIER, D ;
JACKSON, W ;
AMER, NM .
OPTICS LETTERS, 1980, 5 (09) :377-379
[2]   KINKS - LONGITUDINAL EXCITATION DISCONTINUITIES IN INCREASING ABSORPTION OPTICAL BISTABILITY [J].
GIBBS, HM ;
OLBRIGHT, GR ;
PEYGHAMBARIAN, N ;
SCHMIDT, HE ;
KOCH, SW ;
HAUG, H .
PHYSICAL REVIEW A, 1985, 32 (01) :692-694
[3]   PHOTOTHERMAL DEFLECTION SPECTROSCOPY AND DETECTION [J].
JACKSON, WB ;
AMER, NM ;
BOCCARA, AC ;
FOURNIER, D .
APPLIED OPTICS, 1981, 20 (08) :1333-1344
[4]   DEGENERATE 4-WAVE MIXING IN SEMICONDUCTOR-DOPED GLASSES [J].
JAIN, RK ;
LIND, RC .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1983, 73 (05) :647-653
[5]   NONLINEAR OPTICAL-PROPERTIES OF THIN-FILM WAVE-GUIDES DEPOSITED ONTO SEMICONDUCTOR-DOPED GLASSES [J].
PATELA, S ;
JEROMINEK, H ;
DELISLE, C ;
TREMBLAY, R .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (05) :1591-1594
[6]  
PEYGHAMBARIAN N, 1986, OPTICAL BISTABILITY, V3, P126
[7]   OPTICAL-PHASE CONJUGATION IN SEMICONDUCTOR-DOPED GLASSES [J].
ROUSSIGNOL, P ;
RICARD, D ;
RUSTAGI, KC ;
FLYTZANIS, C .
OPTICS COMMUNICATIONS, 1985, 55 (02) :143-148
[8]   ELECTRONIC NONLINEAR OPTICAL SUSCEPTIBILITIES OF SILICATE-GLASSES [J].
THOMAZEAU, I ;
ETCHEPARE, J ;
GRILLON, G ;
MIGUS, A .
OPTICS LETTERS, 1985, 10 (05) :223-225
[9]   ULTRAFAST CARRIER AND GRATING LIFETIMES IN SEMICONDUCTOR-DOPED GLASSES [J].
YAO, SS ;
KARAGULEFF, C ;
GABEL, A ;
FORTENBERRY, R ;
SEATON, CT ;
STEGEMAN, GI .
APPLIED PHYSICS LETTERS, 1985, 46 (09) :801-802