ROLE OF REDIFFUSED PRIMARY ELECTRONS IN SECONDARY-ELECTRON EJECTION FROM A CU(100) SURFACE

被引:8
作者
MULHOLLAN, GA [1 ]
ZHANG, X [1 ]
DUNNING, FB [1 ]
WALTERS, GK [1 ]
机构
[1] RICE UNIV,RICE QUANTUM INST,HOUSTON,TX 77251
来源
PHYSICAL REVIEW B | 1989年 / 39卷 / 12期
关键词
D O I
10.1103/PhysRevB.39.8715
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:8715 / 8717
页数:3
相关论文
共 13 条
[1]   MAGNETIC PROBING DEPTH IN SPIN-POLARIZED SECONDARY-ELECTRON SPECTROSCOPY [J].
ABRAHAM, DL ;
HOPSTER, H .
PHYSICAL REVIEW LETTERS, 1987, 58 (13) :1352-1354
[2]   POLARIZED ELECTRON PROBES OF MAGNETIC-SURFACES [J].
CELOTTA, RJ ;
PIERCE, DT .
SCIENCE, 1986, 234 (4774) :333-340
[3]   DETERMINATION OF SPIN-POLARIZATION FOR ANGLE-RESOLVED AND ENERGY-ANALYZED SECONDARY ELECTRONS [J].
ERBUDAK, M ;
MULLER, N .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1984, 17 (11) :951-953
[4]  
Feder R, 1985, POLARIZED ELECTRONS
[5]   SPIN-DEPENDENT ELASTIC AND INELASTIC ELECTRON-SCATTERING FROM MAGNETIC-SURFACES [J].
HOPSTER, H ;
ABRAHAM, DL ;
PAPPAS, DP .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (10) :5927-5930
[6]   SPIN-POLARIZED SCANNING ELECTRON-MICROSCOPE FOR ANALYSIS OF COMPLICATED MAGNETIC DOMAIN-STRUCTURES [J].
KOIKE, K ;
MATSUYAMA, H ;
MITSUOKA, K ;
HAYAKAWA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (09) :L758-L760
[7]   SCANNING ELECTRON-MICROSCOPE OBSERVATION OF MAGNETIC DOMAINS USING SPIN-POLARIZED SECONDARY ELECTRONS [J].
KOIKE, K ;
HAYAKAWA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (03) :L187-L188
[8]   HIGH-RESOLUTION MAGNETIC MEASUREMENTS AT SURFACES WITH SPIN-POLARIZED ELECTRONS [J].
LANDOLT, M .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1986, 41 (01) :83-89
[9]   SURFACE-STRUCTURAL ANALYSIS BY USE OF SPIN-POLARIZED LOW-ENERGY ELECTRON-DIFFRACTION - AN INVESTIGATION OF THE CU(100) SURFACE [J].
LIND, DM ;
DUNNING, FB ;
WALTERS, GK ;
DAVIS, HL .
PHYSICAL REVIEW B, 1987, 35 (17) :9037-9044
[10]   SPIN POLARIZATION OF SECONDARY ELECTRONS IN TRANSITION-METALS - THEORY [J].
PENN, DR ;
APELL, SP ;
GIRVIN, SM .
PHYSICAL REVIEW B, 1985, 32 (12) :7753-7768