High-speed Atomic Force Microscopy for Capturing Dynamic Behavior of Protein Molecules at Work

被引:75
作者
Ando, Toshio [1 ,2 ]
Kodera, Noriyuki [1 ]
Uchihashi, Takayuki [1 ]
Miyagi, Atsushi [1 ]
Nakakita, Ryo [1 ]
Yamashita, Hayato [1 ]
Matada, Keiko [1 ]
机构
[1] Kanazawa Univ, Grad Sch Sci & Technol, Dept Phys, Kakuma Machi, Kanazawa, Ishikawa 9201192, Japan
[2] JST, CREST, Kawaguchi, Saitama, Japan
来源
E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY | 2005年 / 3卷
关键词
Atomic force microscopy; biological aspects of nanostructures; proteins;
D O I
10.1380/ejssnt.2005.384
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
It seems that only the atomic force microscope (AFM) has a potential to trace a protein in action with high spatial and temporal resolution. To realize that potential, we have been developing a high-speed AFM. We have made efforts not only to enhance the scan speed but also to reduce the tip-sample interaction force as much as possible. The high-speed AFM can capture moving protein molecules and weakly interacting protein molecules on video without disturbing their physiological function. Here we review our studies carried out over the past 10 years, and our preliminary work toward the next generation of the instrument.
引用
收藏
页码:384 / 392
页数:9
相关论文
共 18 条
[1]  
ADAMS SR, 1993, ANNU REV PHYSIOL, V55, P755, DOI 10.1146/annurev.physiol.55.1.755
[2]   A high-speed atomic force microscope for studying biological macromolecules in action [J].
Ando, T ;
Kodera, N ;
Maruyama, D ;
Takai, E ;
Saito, K ;
Toda, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (7B) :4851-4856
[3]   A high-speed atomic force microscope for studying biological macromolecules [J].
Ando, T ;
Kodera, N ;
Takai, E ;
Maruyama, D ;
Saito, K ;
Toda, A .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2001, 98 (22) :12468-12472
[4]  
Ando T., JPN J APPL PHYS
[5]   THE CRYSTAL-STRUCTURE OF THE BACTERIAL CHAPERONIN GROEL AT 2.8-ANGSTROM [J].
BRAIG, K ;
OTWINOWSKI, Z ;
HEGDE, R ;
BOISVERT, DC ;
JOACHIMIAK, A ;
HORWICH, AL ;
SIGLER, PB .
NATURE, 1994, 371 (6498) :578-586
[6]   A magnetically driven oscillating probe microscope for operation in liquids [J].
Han, WH ;
Lindsay, SM ;
Jing, TW .
APPLIED PHYSICS LETTERS, 1996, 69 (26) :4111-4113
[7]   TAPPING MODE ATOMIC-FORCE MICROSCOPY IN LIQUIDS [J].
HANSMA, PK ;
CLEVELAND, JP ;
RADMACHER, M ;
WALTERS, DA ;
HILLNER, PE ;
BEZANILLA, M ;
FRITZ, M ;
VIE, D ;
HANSMA, HG ;
PRATER, CB ;
MASSIE, J ;
FUKUNAGA, L ;
GURLEY, J ;
ELINGS, V .
APPLIED PHYSICS LETTERS, 1994, 64 (13) :1738-1740
[8]   Batch fabrication of sharpened silicon nitride tips [J].
Kitazawa, M ;
Shiotani, K ;
Toda, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (7B) :4844-4847
[9]   Active damping of the scanner for high-speed atomic force microscopy [J].
Kodera, N ;
Yamashita, H ;
Ando, T .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (05)
[10]  
KODERA N, UNPUB