THICKNESS PERIODICITY IN THE AUGER LINE-SHAPES FROM EPITAXIAL (111)PD-(111)CU FILMS

被引：20

作者：

CHAO, SS

VOOK, RW

NAMBA, Y

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1981年 / 18卷 / 03期

关键词：

D O I：

10.1116/1.570929

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：695 / 699

页数：5

共 11 条

[1] A NEW TECHNIQUE FOR DECORATION OF CLEAVAGE AND SLIP STEPS ON IONIC CRYSTAL SURFACES
BASSETT, GA
[J]. PHILOSOPHICAL MAGAZINE, 1958, 3 (33): : 1042 - &
[2] AUGER LINE-SHAPE CHANGES IN EPITAXIAL (111)PD-(111)CU FILMS
CHAO, SS
KNABBE, EA
VOOK, RW
[J]. SURFACE SCIENCE, 1980, 100 (03) : 581 - 589
[3] CHAO SS, 1980, 8TH INT VAC C, V1, P161
[4] CHAO SS, 1979, 37TH P ANN EMSA M SA, P464
[5] DAVID LE, 1976, HDB AUGER ELECTRON S
[6] CHEMICAL AND STRUCTURAL-PROPERTIES OF THE PD-SI INTERFACE DURING THE INITIAL-STAGES OF SILICIDE FORMATION
HO, PS
TAN, TY
LEWIS, JE
RUBLOFF, GW
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1120 - 1124
[7] DETACHABLE (111) CU FILMS FORMED IN ULTRAHIGH-VACUUM
HORNG, CT
VOOK, RW
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01): : 160 - 163
[8] LEED AND AUGER INVESTIGATIONS OF CU(111) SURFACE
JENKINS, LH
CHUNG, MF
[J]. SURFACE SCIENCE, 1971, 24 (01) : 125 - &
[9] NAMBA Y, UNPUBLISHED
[10] QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY AND ELECTRON RANGES
SEAH, MP
[J]. SURFACE SCIENCE, 1972, 32 (03) : 703 - &