HIGH-RESOLUTION ELECTRON-MICROSCOPY OBSERVATIONS OF STACKING-FAULTS IN BETA-SIC

被引:131
作者
KOUMOTO, K
TAKEDA, S
PAI, CH
SATO, T
YANAGIDA, H
机构
[1] CHIBA INST TECHNOL,DEPT IND CHEM,NARASHINO,CHIBA 275,JAPAN
[2] UNIV TOKYO,ADV SCI & TECHNOL RES CTR,MEGURO KU,TOKYO 153,JAPAN
关键词
D O I
10.1111/j.1151-2916.1989.tb06014.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:1985 / 1987
页数:3
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